Santos Tiago, Kern Roman
2018
Semiconductor manufacturing processes critically depend on hundreds of highly complex process steps, which may cause critical deviations in the end-product.Hence, a better understanding of wafer test data patterns, which represent stress tests conducted on devices in semiconductor material slices, may lead to an improved production process.However, the shapes and types of these wafer patterns, as well as their relation to single process steps, are unknown.In a first step to address these issues, we tailor and apply a variational auto-encoder (VAE) to wafer pattern images.We find the VAE's generator allows for explorative wafer pattern analysis, andits encoder provides an effective dimensionality reduction algorithm, which, in a clustering application, performs better than several baselines such as t-SNE and yields interpretable clusters of wafer patterns.