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Publikationen
Hier finden Sie von Know-Center MitarbeiterInnen verfasste wissenschaftliche Publikationen
Santos Tiago, Schrunner Stefan, Geiger Bernhard, Pfeiler Olivia, Zernig Anja, Kaestner Andre, Kern Roman
Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Mode
IEEE Transactions on Semiconductor Manufacturing, IEEE, 2019
Schrunner Stefan, Jenul Anna, Scheider Michael, Zernig Anja, Kaestner Andre, Kern Roman
A Health Factor for Process Patterns - Enhancing Semiconductor Manufacturing by Pattern Recognition in Analog Wafermaps
2019 IEEE International Conference on Systems, Man and Cybernetics (SMC), Bari, Italy, 2019
Schrunner Stefan, Bluder Olivia, Zernig Anja, Kaestner Andre, Kern Roman
A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data
2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA), 2018
Schrunner Stefan, Bluder Olivia, Zernig Anja, Kaestner Andre, Kern Roman
Markov Random Fields for Pattern Extraction in Analog Wafer Test Data
International Conference on Image Processing Theory, Tools and Applications (IPTA 2017), IEEE, Montreal, Canada, 2017