Publikationen

Hier finden Sie von Know-Center MitarbeiterInnen verfasste wissenschaftliche Publikationen

2019

Santos Tiago, Schrunner Stefan, Geiger Bernhard, Pfeiler Olivia, Zernig Anja, Kaestner Andre, Kern Roman

Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Mode

IEEE Transactions on Semiconductor Manufacturing, IEEE, 2019

Journal
Semiconductor manufacturing is a highly innovative branch of industry, where a high degree of automation has already been achieved. For example, devices tested to be outside of their specifications in electrical wafer test are automatically scrapped. In this paper, we go one step further and analyze test data of devices still within the limits of the specification, by exploiting the information contained in the analog wafermaps. To that end, we propose two feature extraction approaches with the aim to detect patterns in the wafer test dataset. Such patterns might indicate the onset of critical deviations in the production process. The studied approaches are: 1) classical image processing and restoration techniques in combination with sophisticated feature engineering and 2) a data-driven deep generative model. The two approaches are evaluated on both a synthetic and a real-world dataset. The synthetic dataset has been modeled based on real-world patterns and characteristics. We found both approaches to provide similar overall evaluation metrics. Our in-depth analysis helps to choose one approach over the other depending on data availability as a major aspect, as well as on available computing power and required interpretability of the results
2019

Geiger Bernhard, Koch Tobias

On the Information Dimension of Stochastic Processes

IEEE Transactions on Information Theory, IEEE, 2019

Journal
2019

Tiago Santos, Stefan Schrunner, Geiger Bernhard, Olivia Pfeiler, Anja Zernig, Andre Kaestner, Kern Roman

Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Mode

IEEE Transactions on Semiconductor Manufacturing, IEEE, 2019

Journal
Semiconductor manufacturing is a highly innovative branch of industry, where a high degree of automation has already been achieved. For example, devices tested to be outside of their specifications in electrical wafer test are automatically scrapped. In this paper, we go one step further and analyze test data of devices still within the limits of the specification, by exploiting the information contained in the analog wafermaps. To that end, we propose two feature extraction approaches with the aim to detect patterns in the wafer test dataset. Such patterns might indicate the onset of critical deviations in the production process. The studied approaches are: 1) classical image processing and restoration techniques in combination with sophisticated feature engineering and 2) a data-driven deep generative model. The two approaches are evaluated on both a synthetic and a real-world dataset. The synthetic dataset has been modeled based on real-world patterns and characteristics. We found both approaches to provide similar overall evaluation metrics. Our in-depth analysis helps to choose one approach over the other depending on data availability as a major aspect, as well as on available computing power and required interpretability of the results
2019

Clemens Bloechl, Rana Ali Amjad, Geiger Bernhard

Co-Clustering via Information-Theoretic Markov Aggregation

IEEE Transactions on Knowledge and Data Engineering, IEEE, 2019

Journal
We present an information-theoretic cost function for co-clustering, i.e., for simultaneous clustering of two sets based on similarities between their elements. By constructing a simple random walk on the corresponding bipartite graph, our cost function is derived from a recently proposed generalized framework for information-theoretic Markov chain aggregation. The goal of our cost function is to minimize relevant information loss, hence it connects to the information bottleneck formalism. Moreover, via the connection to Markov aggregation, our cost function is not ad hoc, but inherits its justification from the operational qualities associated with the corresponding Markov aggregation problem. We furthermore show that, for appropriate parameter settings, our cost function is identical to well-known approaches from the literature, such as “Information-Theoretic Co-Clustering” by Dhillon et al. Hence, understanding the influence of this parameter admits a deeper understanding of the relationship between previously proposed information-theoretic cost functions. We highlight some strengths and weaknesses of the cost function for different parameters. We also illustrate the performance of our cost function, optimized with a simple sequential heuristic, on several synthetic and real-world data sets, including the Newsgroup20 and the MovieLens100k data sets
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